CRDS Laser-Based Analyzer
NEXT-GENERATION CEM ANALYZER FOR HCl, HF, NH3 AND MORE
Delivering your best measurements, our extremely versatile TIGER OPTICS™ T-I Max™ CEM is used for continuous emissions monitoring of gas concentrations for target compounds, both for compliance and process control. The T-I Max CEM analyzer represents the latest advancement in Continuous-Wave Cavity Ring-Down Spectroscopy designed for superior performance and unprecedented speed of response. It is an ideal, proven solution for MATS HCl compliance needs.
Other applications include continuous emissions monitoring of sources, such as cement kilns, power plants, paper mills, and refineries. Using our T-I Max CEM analyzer, you can verify concentrations of target compounds with parts-per-billion accuracy, drift-free stability, and virtually immediate response.
The T-I Max CEM detects NH3, HCl, HF, H2S, and CH4, among other species. You will find our analyzer is easy to install, exceptionally intuitive to use, and effortless to maintain. The modern software enables you to easily configure the analyzer via its touchscreen display and to communicate with virtually any manufacturer’s DAHS. Two units fit into one 19” rack mount. The robust design—free of moving parts—results in an analyzer that has a high mean time between failures (MTBF) and a very low cost of ownership (CoO).
DESIGNED FOR CONTINUOUS EMISSIONS MONITORING (CEM), THE ROBUST AND COMPACT T‑I MAX CEM OFFERS:
- Accuracy traceable to the world’s major national reference labs
- Specificity—no interference
- Sub-ppb detection capability
- No periodic sensor replacement/maintenance
- Unprecedented speed of response
- Wide dynamic range
APPLICATIONS
- CEM Standards Preparation
- Monitoring cement plant stack emissions
- Continuous emission monitoring for refineries, power generation, energy, and pulp and paper industries to monitor pollution levels
- Refinery HF alkylation emissions monitoring to prevent dangerous leaks
- Accurate monitoring of power generation plant flue gas emissions to comply with federal and state air emission standards
- Semiconductor
- Cleanrooms
- Airborne Molecular Contaminants
- Research & Development
DETECTION CAPABILITY
| Model | Range | LDL (3σ) | Precision (1σ) @ zero |
|---|---|---|---|
| T-I Max CEM NH3 | 0 – 40 ppm | 6 ppb | 2 ppb |
| T-I Max CEM HCl | 0 – 4 ppm | 0.75 ppb | 0.25 ppb |
| T-I Max CEM HF | 0 – 1 ppm | 0.15 ppb | 0.05 ppb |
| T-I Max CEM H2S | 0 – 500 ppm | 40 ppb | 13 ppb |
| T-I Max CEM CH4 | 0 – 20 ppm | 1.5 ppb | 0.5 ppb |
SPECIFICATIONS
| Performance | |
|---|---|
| Operating range† | See Detection Capability table |
| Detection limit (LDL, 3σ/24h) | See Detection Capability table |
| Precision (1σ, greater of) | ± 0.75% or 1/3 of LDL |
| Accuracy (greater of) | ± 4% or LDL |
| Speed of response | 1 min to 95% (NH3), 30 sec to 90% (for HCl and HF), 30 sec to 95% (all others) |
| Environmental conditions | 10°C to 40°C, 30% to 80% RH (non-condensing) |
| Storage temperature | -10°C to 50°C |
| Gas Handling System and Conditions* | |
| Wetted materials | 316L stainless steel, 10 Ra surface finish |
| Gas connections | 1/4″ male VCR inlet & outlet (1/4″ Swagelok adapters included) |
| Inlet pressure | 0 – 10 psig |
| Outlet pressure | Vacuum (<10 Torr) |
| Flow rate | ∼2 slpm |
| Sample gases | Air, diluted stack gas |
| Gas temperature | Up to 60°C |
| Dimensions, H x W x D | |
| Standard sensor | 8.73″ x 8.57″ x 23.6″ (222 mm x 218 mm x 599 mm) |
| Sensor rack (fits up to two sensors) | 8.73″ x 19.0″ x 23.6″ (222 mm x 483 mm x 599 mm) |
| Weight | |
| Standard sensor | 33 lbs (15 kg) |
| Electrical and Interfaces | |
| Platform | Max series analyzer |
| Alarm indicators | 2 user programmable, 1 system fault, Form C relays |
| Power requirements | 90 – 240 VAC 50/60 Hz |
| Power consumption | 40 Watts max. |
| Signal output | Isolated 4–20 mA per sensor |
| User interfaces | 5.7” LCD touchscreen, 10/100 Base-T Ethernet |
| USB, RS-232, RS-485, Modbus TCP (optional) | |
| Data storage | Internal or external flash drive |
| Certification | CE Mark |
| Patents | |
| U.S. Patent #7,277,177 | |
*Vacuum source with >2 slpm @ 10 Torr required
†Higher ranges are available, please contact us.
Learn about our service, technical support, spares, and our CRDS Analyzer | Performance Verification Program
Analyzer in service? Need a rental CRDS analyzer? Ask us how we can help.
ANALYZE WITH EASE™
Airborne Molecular Contaminants
ANALYZE WITH EASE™
Airborne Molecular Contaminants
SALES | TRAINING INQUIRIES
AMERICAS: info.americas@process-insights.com
EMEAI (includes India): info.emeai@process-insights.com
APAC: info.apac@process-insights.com
CHINA: info.cn@process-insights.com
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