Semiconductor
CRDS Analytical Solutions for the Semiconductor Industry
ANALYTICAL SOLUTIONS FOR Semiconductor Fabrication
Semiconductors are considered the brains of modern electronics. Our TIGER OPTICS™ Cavity Ring-Down Spectroscopy (CRDS) gas analyzers seamlessly detect parts-per-billion (ppb) and parts-per-trillion (ppt) levels and delivers bulk gas monitoring for trace H2, H2O, O2, CH4, CO, CO2, Kr, NH3, and Xe, UHP ammonia for HB LED production, tool monitoring for trace H2O and HF, and continuous AMC monitoring for ambient HCl, HF, and NH3.
Specialty gases of superior quality play a vital role as raw materials and process gases across various industries. From carbon dioxide in beverages to ammonia in LED manufacturing and silane in semiconductor fabrication, maintaining high purity standards for specialty gases is critical. The presence of moisture impurities, for instance, can significantly impact the efficiency of resulting LEDs. The semiconductor industry demands ultra-high purity gases, whether it’s silane or germane for epitaxy, fluorine compounds for etching processes, or cleaning gases. Process Insights offers highly sensitive, accurate, and user-friendly analysis instruments. These instruments utilize the renowned Cavity Ring-Down Spectroscopy (CRDS) technique and cater to a wide range of specialty gases and applications.
What is Cavity Ring Down Spectroscopy?
Technical Specifications of Tiger Optics CRDS
Cavity Ring-Down Spectroscopy: Principles, Applications, and Benefits
Trace Moisture Analysis with CRDS
What is a trace moisture analyzer
The Purity Imperative: Specialty Gases for Critical Industries
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Beverages
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LED manufacturing
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Semiconductor fabrication
- Medical and pharmaceutical applications
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Aerospace and defense
- Benzotriazole Monitoring in Semiconductors with Fiber Optic UV-Vis Spectroscopy
The High-Stakes Reality of Impurities
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Moisture contamination can reduce LED brightness and lifespan
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Oxygen impurities can damage semiconductor wafers
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Carbon dioxide purity affects beverage taste and shelf life
Ultra-High Purity Demands
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Silane and germane for epitaxy processes
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Fluorine compounds for etching
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Cleaning gases for contamination control
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Nitrogen and argon for chamber purging

SALES | TRAINING INQUIRIES
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NIR Optical Analyzers for Liquids and Gases
From dynamic chemical blending and wafer cleaning to metals concentration monitoring and on-site gas blending, precision matters.
✅ In situ monitoring improves yields, reduces chemical waste/costs, and optimizes cycle times.
✅ Detect metals contamination down to 5 ppm with GUIDED WAVE 508 UV-VIS and Clearview db.
✅ Ensure stable, on-demand gas blends with real-time NIR quality data.
With our GUIDED WAVE Clearview db product line, you get 24/7 critical process data to keep operations running at peak performance.
CONTINUOUS QUALITY CONTROL (CQC) IN THE SEMICONDUCTOR INDUSTRY
Cavity Ring-Down Spectroscopy (CRDS) gas analyzers from Process Insights have a long history in industrial gas, medical gas, and chemical processing, enabling the detection of moisture and other rogue impurities in process gas streams, including inert, reactive, corrosive, bulk, and specialty gases.
Cavity Ring-Down Spectroscopy (CRDS) Technology delivers a highly sensitive and precise analytical technique used for the detection and measurement of trace gases and isotopes in a sample. It is a non-destructive technique that provides quantitative measurements of molecular absorption spectra.


T-I MAX X3 Airborne Molecular Contaminant (AMC) MONITORING SOLUTION
Simultaneously Monitor HF, HCl, and NH3 in Real-Time – Next-Generation Trace Gas Analyzers for Detection & Continuous Monitoring of Airborne Molecular Contaminants in Semiconductor Cleanrooms, FOUP Cleaning Tools, Reticle Nests and Sub Fab Environments. Our T-I Max™ series analyzers monitor invisible defect generators, commonly found lurking in and around equipment, personnel, wafer carriers and cleanroom bays.

MAX300-TGM™ TOXIC GAS MONITOR
Our EXTREL™ MAX300-TGM™ Toxic Gas Monitor is a real time monitoring solution with analysis speeds of 0.4 seconds per chemical and gas clearing times of less than 3 seconds. These impressive speeds exceed industry requirements for continuous monitoring. With the ability to analyze 15+ chemicals per sample point, the MAX300-TGM toxic gas analyzer provides maximum efficiency at an extremely low cost-per-chemical, per sample point.

VeraSpec™ APIMS™
Our TIGER OPTICS™ VeraSpec™ Atmospheric Pressure Ionization Mass Spectrometer (APIMS) is designed for reliable and repeatable low parts-per-trillion detection limits for contamination control in Ultra-High Purity (UHP) gases used in semiconductor and other high-tech industrial applications.







































